理学院数理讲坛(第三十二讲)
发布时间: 2010-11-03 00:00
作者:
点击:[]

理学院数理讲坛(第三十二讲)

报告人:Cary Y. Yang, 教授,浙江大学包玉刚讲座教授, School of Engineering, Santa Clara University
报告题目:Temperature Dependence of Carbon Nanofiber Resistance
报告时间:2010年11月9日10:00-11:30
报告地点:理学院北楼311

目前的研究焦点:
Silicon Nanoelectronics. Study of crosstalk noise and substrate effects in on-chip interconnects; science-based compact modeling for transistors and interconnects in the sub-100nm regime.

Carbon-based Nanostructures.  Characterization and modeling of CNT/CNF interconnects and thermal interfaces in next-generation integrated circuits; exploratory study of electrically probing living cells with CNT.

代表性论文:
1. H. Kitsuki, T. Yamada, D. Fabris, J.R. Jameson, P. Wilhite, M. Suzuki, and C.Y. Yang, “Length dependence of current-induced breakdown in carbon nanofiber interconnects,” Applied Physics Letters 92,  173110(1-3) (2008). 

2. Q. Ngo, T. Yamada, M. Suzuki, Y. Ominami, A. M. Cassell, J. Li, M. Meyyappan, and C.Y. Yang, "Structural and Electrical Characterization of Carbon Nanofibers for Interconnect Via Applications," IEEE Transactions on Nanotechnology 6, 688-695 (2007).

3. M. Suzuki, Q. Ngo, H. Kitsuki, K. Gleason, Y. Ominami, and C.Y. Yang, "Bright-field transmission imaging of carbon nanofibers on bulk substrate using conventional scanning electron microscopy," Journal of  Vacuum Science & Technology  B25, 1615-1621 (2007).

4. M. Suzuki, H. Kitsuki, Q. Ngo, T. Yamada, K. Gleason, Y. Ominami, B. Roth, M. Betts, A.M. Cassell, J. Li, and C.Y. Yang, "Image Formation Mechanisms in Scanning Electron Microscopy of Carbon Nanofibers on Substrate," Microscopy & Microanalysis 13 (Suppl 2), 580-581 CD (2007).

5. M. Suzuki, Y. Ominami, Q. Ngo, A.M. Cassell, J. Li, and C.Y. Yang, "Current-induced breakdown of carbon nanofibers," Journal of Applied Physics 101, 114307(1-5) (2007).

6. M. Suzuki, T. Yamada, and C.Y. Yang, “Monte Carlo Simulation of SEM Bright-contrast Images of Suspended Carbon Nanofibers,” Applied Physics Letters 90, 083111(1-3) (2007).


欢迎感兴趣的老师和同学参加!